Test Probes
www.testprobeproduct.com
Perfomance is COST
We give you BOTH
Wafer Mapping / Die Sort
LD Microprecision has achieved breakthrough in ultrafine micro-machining process capability in the design and manufacturing of test probes for wafer sort / mapping. Using our special design equipment, we are able to produce this high performance probes with tight tolerance specification to ensure effective and long lasting applicaiton.


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Probes needles materials both plated and unplated type are used with diameters from 0.2mm (8mil) to 0.7mm (28mil). We are able to achive ultra fine tip of radius as small as 6 microns.
  • Tungsten
  • Tungsten Rhenium
  • Beryllium Copper
  • Tungsten Carbide
  • Paliney

By applying special developed process(es) we are able to solder and control the "blade" to the probe needle diamention to within 10 microns. The blade finishing can either nickel or gold plate.

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In nano technology, small is beautiful.
That’s what we do.
We also provide design to customers specifications.
For detail, please contact : sales@ld-micro.com