Test Probes

Test Probes

Test Probes

LD Microprecision designs, manufactures, and markets a wide range of test probes (both cantilever & blade) commonly use in the die-sort and wafer mapping process. Our specially designed equipments and proprietary processes enable us to produce ultra fine probes with tight tolerance specification to ensure effective and long lasting applications. Tips radius down to six(6) microns can be maintained.


  • Tungsten Rhenium (WR)
  • Tungsten (W)
  • Beryllium Copper (BeCu)
  • Paliney 7 (P7)


  • 0.20mm (8mils)
  • 0.25mm (10mils)
  • 0.50mm (20mils)

Ordering Example
Product Code Material Probe Diameter Taper Length Tip Configuration Length Part Number
TP WR 10 mils 2.65 Flat 2 inch TPWR10-2.65-F0.5-2.0
TP W 20 mils 2.65 Radius 1.25 inch TPW20-2.65-R0.2-1.25
TP BC 8 mils 2.65 Flat 2 inch TPBC08-2.65-F0.4-2.0

* For sizes not found above, we can custom made to meet customer requirements.

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