Test Probes

Test Probes

Test Probes

LD Microprecision designs, manufactures, and markets a wide range of test probes (both cantilever & blade) commonly use in the die-sort and wafer mapping process. Our specially designed equipments and proprietary processes enable us to produce ultra fine probes with tight tolerance specification to ensure effective and long lasting applications. Tips radius down to six(6) microns can be maintained.


  • Tungsten Rhenium (WR)
  • Tungsten (W)
  • Beryllium Copper (BeCu)
  • Paliney 7 (P7)


  • 0.20mm (8mils)
  • 0.25mm (10mils)
  • 0.50mm (20mils)

Ordering Example
Product CodeMaterialProbe DiameterTaper LengthTip ConfigurationLengthPart Number
TPWR10 mils2.65Flat2 inchTPWR10-2.65-F0.5-2.0
TPW20 mils2.65Radius1.25 inchTPW20-2.65-R0.2-1.25
TPBC8 mils2.65Flat2 inchTPBC08-2.65-F0.4-2.0

* For sizes not found above, we can custom made to meet customer requirements.

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